microdevice probe station

The tool provides instant I-V and C-V measurements at ambient temperature

Details

6 GHz Real time oscilloscope

Extendable fast oscilloscope for extremely precise measurements

Details

50 MHz lock-in amplifier with TIA

Precise fast lock-in amplifier with current trans-impedance amplifier.

Details

Source measure units

• 1. fA pulsed DC SMU Agilent 2636B
• 2. Keithley 6221 Sigma-Delta AC+DC current source
• 7.5 nano voltmeter
• SR680 Stanford preamplifier

Details

Central facilities

Our group students have unrestricted access to advanced material and electrical characterization techniques such as SEM, TEM, STM, dilution refridgerator, PPMS, spectroscopy and so forth via central research facility (CRF)

CNS

Neolab-server1

32 Core Intel workstation with 8 GB graphic card and 96 GB RAM

Neolab-server2

76 Core Intel Xeon Platinum workstation with 16 GB graphic card and 512 GB RAM.

Departmental facilities

The department provides excellent facilities for device fabrication and characterization

SFL

Central facilities

Nanoscale device fabrication using electron beam lithography, dry etching and so on

CNS